This plot shows the relation between SNR (called 'snr' in the database) and 
ETC flux ('flux_tot') for the HARPS IDPs.
The flux_tot parameter measures the flux of the object during the exposure. 
The snr parameter measures the photon noise of the target flux, convolved with
the quality of the reduction process. In theory 
a square-root law is expected if no additional noise sources (introduced by
reduction artefacts) exist. 
See the plot tutorial for more.</font><p><font size="2">

HAM stands for high-accuracy mode, EGGS for the high-efficiency mode.</font><p><font size="2">

The upper and lower boundaries are scaled square-root laws and
  purely empirical. They are plotted for orientation and are not fits. 
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NOTE: The 'Data downloads' for the HAM mode may take very long or time out.