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Preliminary CCD tests
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EEV 44-82
CCD name : Linda
Serial number : 8131-13-1
Type : Backside, Single layer AR Pixel size 15x15 µm
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of outputs : 2
Overall rating : --
Test on December 1999
Left readout port Readout speed: 350kp/s Conversion Factor =1.78e-/ADU ± 0.0075 for 24837.24ADU RMS noise =4.04e- ± 0.32 bandwidth = 5nm Wav. PRNU rms% QE% 310 4.55 37.6 320 4.27 39.7 330 4.10 43.4 340 4.06 45.7 350 4.11 47.9 360 4.08 49.3 370 3.71 55.9 380 2.81 64.7 390 2.22 73.3 400 1.90 77.7 440 1.45 85.0 460 1.37 85.2 500 1.26 84.7 540 1.18 83.0 560 1.15 81.5 600 1.10 79.6 640 1.07 76.9 660 1.07 74.5 700 1.02 68.9 740 1.19 62.0 760 1.18 58.3 800 1.36 49.4 840 1.64 38.9 860 1.70 33.4 900 2.19 23.0 940 3.42 13.3 960 4.20 9.75 1000 6.46 3.68 1100 8.37 0.05
Cosmetic defects
flat field
350nm (UV)
bandwidth: 5nm
600 nm
bandwidth: 5nm
Cosmetic defects available here ...
900 nm
bandwidth: 5nm
Bias
Long exposure dark image (1 hour @-120C) two port readout.
Type of defect Location Number of pixels affected
Readout noise/Conversion factor
Left readout port Readout speed: 350kp/s Conversion Factor =1.78e-/ADU ± 0.0075 for 24837.24ADU RMS noise =4.04e- ± 0.32Linearity (TDI method)
Left readout port: RMS non linearity (%)=0.0206274 Peak to peak non linearity (%)=0.324196 Right readout port: RMS non linearity (%)=0.0196543 Peak to peak non linearity (%)=0.298219![]()
Dark current
Not measured
Charge Transfer Efficiency (CTE)
Left readout port Readout speed: 166kp/s
Horizontal CTE = 0.99999987 Vertical CTE = 0.99999948
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