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Test Commands

The quality control can be done by six test commands in the MIDAS CCDTEST context. The commands are called TESTX/CCD where X can be: B for the bias, D for dark, F for flat, T for transfer, S for shutter, and C for charge transfer efficiency. All output (i.e. ASCII and MIDAS tables, postscript files of graphics and display output) will be put in the users working directory. In addition, the MIDAS logfile will contain a complete log of the results. A description of the commands and the output produced follows below.


Petra Nass