Up: Test Commands
The command does a series of tests on a catalogue of dark frames
The command uses the bias offset that is expected in the keyword
BIASMEAN which is produced by the command TESTB/CCD.
Alternatively, the user can store the name of the combined bias
frame created by the command TESTB/CCD in the keyword BIASMEAN.
- An estimate of the electron analogue-to-ADU conversion factor;
- A map of dark current across the CCD.