mirror sites: PL (internal link) HQ     [?]

Quality Control and
Data Processing


CAL | HC | refs | QC
QUALITY CONTROL
    HOME
UVES QC
   MOS - Wavelength Solution
Pipeline
Solar&sky spectra
QC links:
UVES: MOS Wavelength solution
 
HC PLOTS
Resolving Power REDU 580
Dispersion REDU 580
Nuber of Lines REDU 580
WL min REDU 580
WL max REDU 580
QC1 database (advanced users): browse | plot

We calculate the wavelength solution and measure the quality of the wavelength calibration solution. It is based on QC1 parameters of two sets of WAVECAL data, 1 set in BLUE mode and 1 set in RED mode, each set comprising a single RAW frame. Depending of wavelength setting ,the data are recorded every day or on another time scale.

Note that in contrast to fibres 2-8 which are illuminated by the robotic fibre projector fed by a Thorium-Argon lamp, fibre 1 is illuminated by the simultaneous calibration wavelength calibration lamp.


Parameters trended

QC1_parameters

FITS key QC1 database: table, name definition class* HC_plot** more docu
QC.WLENMIN uves_fib_wave..lambda_min minimum wavelength [Angstrom] HC [docuSys coming]
QC.WLENMAX uves_fib_wave..lambda_max maximum wavelength [Angstrom] HC [docuSys coming]
QC.LINE.RESIDRMS uves_fib_wave..resid_rms sigma of residual of line positions to fit [milli-Angstrom] HC [docuSys coming]
QC.RESOLMED uves_fib_wave..resol_med median resolving power of lines selectedHC [docuSys coming]
QC.NLINSOL uves_fib_wave..nlin_sol HC [docuSys coming]
QC.INTAVG uves_fib_wave..int_avg average intensity of ThAr lines (divided by EXPTIME)HC [docuSys coming]
*Class: KPI - instrument performance; HC - instrument health; CAL - calibration quality; ENG - engineering parameter
**There might be more than one.

Trending

Montage of the different QC reports

The montage displays:

box 1, left to right, top to bottom:

  • plot 1:trace across the middle row of the UPPER chip RAW frame
  • plot 2:trace across the middle column of the RAW frames (ie both chips 'stuck together')
  • plot 3:trace across the middle row of the LOWER chip RAW frame
  • plot 4:For Fibre 4 (arbitrarily selected as representative), measured resolving power of each line used in the solution for the UPPER chip as a function of X
  • plot 5:For Fibre 4 (arbitrarily selected as representative), measured resolving power of each line used in the solution for the LOWER chip as a function of X

    box 2, top to bottom:

  • plot 6:For Fibre 4 (arbitrarily selected as representative), residuals of measured line positions with respect to the physical model for the UPPER chip as a function of X pixels coordinate; for the lines included in the final solution (red crosses) and those not included in the final solution (black crosses)
  • plot 7:For Fibre 4 (arbitrarily selected as representative), residuals of measured line positions with respect to the physical model for the LOWER chip as a function of X pixels coordinate; for the lines included in the final solution (red crosses) and those not included in the final solution (black crosses)
  • plot 8:For Fibre 4 (arbitrarily selected as representative), residuals of measured line positions with respect to the physical model for the UPPER chip as a function of order number; for the lines included in the final solution (red crosses) and those not included in the final solution (black crosses)
  • plot 9:For Fibre 4 (arbitrarily selected as representative), residuals of measured line positions with respect to the physical model for the LOWER chip as a function of order number; for the lines included in the final solution (red crosses) and those not included in the final solution (black crosses)

    box 3, top to bottom:

  • plot 10:For Fibre 4 (arbitrarily selected as representative), pixel-space representation of found but not used (black) and found and used (red) in the solution lines as a function of order for the UPPER chip
  • plot 11:For Fibre 4 (arbitrarily selected as representative), pixel-space representation of found but not used (black) and found and used (red) in the solution lines as a function of order for the UPPER chip

    Scoring&thresholds Parameters trended

    Scoring thresholds have been set with an offset from the median for some plots (Resolving power, WLmin and Max) or as fixed values (for the dispersion).

    In theorie the thresholds should be set for the Resolving Power to the value found in teh user manual
    WL min_wav max_wav NMaxFib Gap [nm]
    520 414 621 6 1
    580 476 684 8 5
    860 660 1060 8 10

    History

    The trending of the Wave parameters during the life time of the instrument is best be seen with the full history trending plots shown here: FULL history.

    Algorithm Parameters trended

  • resid_avg, resid_rms: mean and sigma of the line positions to fit. These parameters are useful to check precision of wavelength calibration solution.
  • resol_med, resol_rms: measured median iand sigma of the resolving power of lines selected
  • fwhm_med, fwhm_rms: measured median and sigma FWHM in X of lines selected
  • nlin_tot: total number of lines found
  • nlin_res: Number of lines with residual < 0.1 nm. This number gives an idea of the precision of the final solution. The higher the number the more precise is the solution.
  • nlin_sel: number of lines selected which could be cross-identified with the catalogue
  • nlin_sol: number of lines identified and accepted for determining the final wavelength calibration solution
  • nlin_tot_1stiter: The Pipeline automatically adjusts the line detection threshold iteratively until it detects a number of lines between the --minlines and --maxlines command line parametres of the recipe. This is the number of lines detected in the FIRST iteration, and so is less sensitive to pipeline artifacts
  • nlin_niter is the number of lines used threshold adjustment iterations required to arrive at final solution
  • nlin_int: number of lines selected in ThAr intensity check
  • int_avg: average intensity of ThAr lines (divided by EXPTIME) of the selected line list.


  • Send comments to <qc_uves@eso.org> powered by QC [webCMS v1.0.1]