PIPELINES AT ESO
Pipelines are used at ESO to process both calibration data and science data
and to retrieve quality information.
There is a dedicated
pipeline for each VLT and VLTI instrument.
Find general information about ESO reduction pipelines here.
The main functionalities of the pipelines are:
QC Garching creates master calibration data from all raw calibration data. The
raw data are stored in the ESO Archive and are public. They are
quality-checked and used for data reduction and for trending.
- create master calibration data,
- reduce science frames,
- extract QC information from the data.
For selected instrument modes, we offer science-grade data products processed
with the pipelines.
There are two instances of the data reduction pipelines:
The automatic mode is used for quick look and for on-site quality
control. It processes all raw data sequentially, as they arrive from the
instrument. If calibration products ("master calibrations") are required for
processing science data, these are taken from a database with standard,
pre-manufactured calibration products. The automatic mode is not tuned to
obtain the best possible results.
- at the instrument workstation on Paranal, running in automatic mode,
- at HQ Garching, run by the Quality Control Group in the optimized mode.
The optimized mode is the mode, which uses all data of a night, including the
daytime calibrations. The calibration data are sorted and grouped according to
their dependencies. Master calibration data are created. Their quality is
The VIRCAM pipeline is publicly available here. Under this link
you also find the pipeline Users Manual.
VIRCAM is equipped with 16 2k x 2k NIR detectors.
RAW DATA EXTENSIONS
Raw data come as FITS files with one header unit and 16 extensions,
each fits extension contains a detector specific header and the
counts of the 2k x 2k pixel.
Since the VIRCAM detector controllers are configured to sum up the counts of each
NDIT exposure (instead of averaging on the chip), accumulated counts in
a saved frame correspond to an exposure time of NDIT times DIT.