Preliminary CCD tests
CCD Test report
EEV 44-82
CCD name : Elvis
Serial number : 8171-19-1
Type : Backside, Single layer AR Pixel size 15x15 µm
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of outputs : 2
Overall rating : Science
Tested on Feb2000
Quantum Efficiency, PRNU
Clock mode: read 350kps LR stripe512
Conversion Factor= 1.853e-/ADU ±0.006167 for 25142.3ADU
RMS noise = 4.5059e- ±0.3883
CCD temperature : -137.5Cº
Window area is : X1= 63 X2= 1061 Y1= 14 Y2= 507
Bandwidth 5nm
Wav. PRNU rms% QE%
320 3.527 42.8 ±1.206
330 3.245 47.6 ±1.374
340 3.071 50.5 ±0.9844
350 2.972 51.7 ±0.5068
360 2.815 53.8 ±0.5323
370 2.49 58.4 ±0.5763
380 1.918 67.1 ±0.6633
390 1.544 75.2 ±0.7728
400 1.348 79.5 ±0.8047
420 1.13 84 ±0.8466
440 1.038 86 ±0.862
460 0.9689 85.9 ±0.8633
500 0.8851 85.2 ±0.8541
540 0.8441 83.8 ±0.8434
560 0.8262 82.5 ±0.8247
600 0.7998 81.1 ±0.8032
640 0.8002 79.2 ±0.7719
660 0.8352 77.6 ±0.7517
700 1.102 73.7 ±0.6885
740 1.728 68.1 ±0.6192
760 2.063 63.9 ±0.5718
800 2.467 54.9 ±0.4505
840 2.755 45.6 ±0.3823
900 3.22 31 ±0.2495
940 4.745 19.1 ±0.1472
1000 7.266 5.02 ±0.03766
1040 7.378 0.831 ±0.00619
1100 10.68 0.104 ±0.0007669
Cosmetic defects
flat field
350nm (UV), bandwidth 5nm
High level
Low level
600 nm, bandwidth 5nm
High level
Low level
900 nm, bandwidth 5nm
High level
Type of defect Location (x,y) Number of pixels affected 5 neighboring traps x=1765 y=1515 5x2000
Bias
Type of defect Location Number of pixels affected Hot pixel x=1816 y=1513 1500
Long exposure dark image
Readout noise/Conversion factor
Readout speed: 166kps
Right readout port
Conversion Factor= 1.723e-/ADU ±0.0066 for 26764.3ADU
RMS noise = 4.18e- ±0.30
Readout speed: 166kps
Left readout port
Conversion Factor= 1.701e-/ADU ±0.0062 for 27256.7ADU
RMS noise = 4.27e- ±0.30
Readout speed:350kps
Right readout port
Conversion Factor= 1.880e-/ADU ±0.0065 for 26431.1ADU
RMS noise = 4.71e- ±0.41
Readout speed:350kps
Left readout port
Conversion Factor= 1.843e-/ADU ±0.0062 for 26936.7ADU
RMS noise = 4.57e- ±0.38
Linearity (TDI method)
To be done
Dark current
Data to be reduced
Charge Transfer Efficiency (CTE)
Horizontal CTE = 0.99999891
Vertical CTE = 0.99999944
