This is the trending report for monitoring UVES Resolution based on QC
parameters derived from Wavelength Calibration frames.
This report presents a second set of detailed parameters of the
wavelength solution for the UPPER chip of the RED 580.0nm, 1x1 binning
data, 4pts/625kHz/lg readout mode, 0.3 arcsec slit-width setup.
The individual plots describe:
The average of the resolution values measured for each line included in the final selection, (this is a repeat of the data presented in the RESOLUTION overview report.
empty
The total number of lines found in the frame. The PL automatically adjusts the
detection threshold until the number of lines found falls within the
--minlines and --maxlines parameters of the recipe, by default 1000
and 1400 for the REDU chip
The RMS of the resolution values measured for each line included in the final selection
The number of lines included in the calculation of the average of the intensity
The number of lines included in the final wavelength calibration
solution. The selection is made in a two step process, first line with
residuals larger than --tolerance (default 0.6 pix) are discarded,
then the remaining list is further refined with kappa-sigma clipping
controlled by the --kappa (default 4.0 sigma) recipe command line
option.
Find more information about UVES Wavelength Solution monitoring here.
General information
Click on any of the plots to see a close-up version.
The latest date is indicated on top of the plot, data points belonging to that date are specially marked.
If configured,
statistical averages are indicated by a solid line, and thresholds by broken lines
outliers are marked by a red asterisk. They are defined as data points outside the
threshold lines
"aliens" (= data points outside the plot Y limits) are marked by a red arrow (↑ or ↓)
you can download the data for each parameter set if the 'Data downloads' link shows up
mirror sites:
PL
HQ
score overview
